- PII
- 10.31857/S0023476124050012-1
- DOI
- 10.31857/S0023476124050012
- Publication type
- Article
- Status
- Published
- Authors
- Volume/ Edition
- Volume 69 / Issue number 5
- Pages
- 755-763
- Abstract
- The paper provides digital processing of 2D X-ray projection images of a Coulomb-type point defect in a Si(111) crystal recorded by a detector against the background of statistical Gaussian noise. A managed filter and a wavelet filter with a 4th-order Daubechies function are used. The efficiency of filtering 2D images is determined by calculating the relative quadratic deviations of the intensities of filtered and reference (noiseless) 2D images averaged over all points. A comparison of the calculated values of the relative deviations of the intensities shows that the considered methods work quite well and both, in principle, can be effectively used in practice for noise processing of X-ray diffraction images used for 3D reconstruction of nanoscale defects of crystal structures.
- Keywords
- Date of publication
- 15.09.2025
- Year of publication
- 2025
- Number of purchasers
- 0
- Views
- 12
References
- 1. Asadchikov V., Buzmakov A., Chukhovskii F. et al. // J. Appl. Cryst. 2018. V. 51. P. 1616. https://doi.org/10.1107/S160057671801419X
- 2. Danilewsky A.N., Wittge J., Croell A. et al. // J. Cryst. Growth. 2011. V. 318. P. 1157. https://doi.org/10.1016/j.jcrysgro.2010.10.199
- 3. Danilewsky A., Helfen L., Hamann E., Baumbach T. // Phys. Rev. Lett. 2017. V. 119. P. 215504. https://doi.org/10.1103/PhysRevLett.119.215504
- 4. Chukhovskii F.N., Konarev P.V., Volkov V.V. // Acta Cryst. A. 2020. V. 76. P. 16. https://doi.org/10.1107/S2053273320000145
- 5. Бондаренко В.И., Конарев П.В., Чуховский Ф.Н. // Кристаллография. 2020. Т. 65. № 6. С. 845. https://doi.org/10.31857/S0023476120060090
- 6. Chukhovskii F.N., Konarev P.V., Volkov V.V. // Crystals. 2023. V. 13. P. 561. https://doi.org/10.3390/cryst13040561
- 7. Yang W., Hong J.-Y., Kim J.-Y. et al. // Sensors. 2020. V. 20. P. 3063. https://doi.org/10.3390/s20113063
- 8. Hendriksen A.A., Bührer M., Leone L. et al. // Sci. Rep. 2021. V. 11. P. 11895. https://doi.org/10.1038/s41598-021-91084-8
- 9. Liu N., Schumacher T. // Sensors. 2020. V. 20. P. 1423. https://doi.org/10.3390/s20051423
- 10. Hamming R.W. Numerical Methods for Scientists and Engineers. Dover Publications, 2012. 752 p.
- 11. He K., Sun J., Tang X. // IEEE Trans. Pattern Anal. Machine Intell. 2013. V. 35. № 6. P. 1397. https://doi.org/10.1109/TPAMI.2012.213
- 12. Karumuri R., Kumari S.A. // IEEE2nd International Conference on Communication and Electronics Systems (ICCES), 2017. p. 545. https://doi.org/10.1109/CESYS.2017.8321137
- 13. Li Z., Zheng J., Zhu Z. et al. // IEEE Trans. Image Process. 2015. V. 24. P. 120. https://doi.org/10.1109/TIP.2014.2371234
- 14. Caraffa L., Tarel J.P., Charbonnier P. // IEEE Trans. Image Process. 2015. V. 24. № 4. P. 1199. https://doi.org/10.1109/TIP.2015.2389617
- 15. Ham B., Cho M., Ponce J. // IEEE Trans. Pattern Anal. Mach. Intell. 2018. V. 40. № 1. P. 192. https://doi.org/10.1109/TPAMI.2017.2669034
- 16. Sun Z., Han B., Li J. et al. // IEEE Trans. Image Process. 2020. V. 29. P. 500. https://doi.org/10.1109/TIP.2019.2928631
- 17. Pham C.C., Ha S.V.U., Jeon J.W. // Pacific-Rim Symp. on Image and Video Technology, Gwangju, Republic of Korea. 2011. P. 323. https://doi.org/10.1007/978-3-642-25367-6_29
- 18. Pham C.C., Jeon J.W. // 19th IEEE Int. Conf. on Image Processing. Orlando, FL, USA. 2012. P. 993. https://doi.org/10.1109/icip.2012.6467522
- 19. Tsai C.L., Tu W.C., Chien S.Y. // IEEE Int. Conf. on Image Processing (ICIP), Québec City, Québec, Canada. 2015. P. 43. https://doi.org/10.1109/ICIP.2015.7350756
- 20. Zhang Y.Q., Ding Y., Liu J. // IET Image Process. 2013. V. 7. № 3. P. 270. https://doi.org/10.1049/iet-ipr.2012.0351
- 21. Shujin Zhu, Zekuan Yu // IET Image Process. 2020. V. 14. № 11. P. 2561. https://doi.org/10.1049/iet-ipr.2019.1471
- 22. Рехвиашвили С.Ш. // Письма в ЖТФ. 2002. Т. 28. № 6. С. 46.
- 23. Потапов А.А., Рехвиашвили С.Ш. // ЖТФ. 2018. Т. 88. № 6. С. 803. https://doi.org/10.21883/JTF.2018.06.46008.2159
- 24. Mallat S. A Wavelet Tour of Signal Processing. The Sparse Way. 3rd Edition. Academic Press, 2008. 832 p.
- 25. Дремин И.М., Иванов О.В., Нечитайло В.А. // Успехи физ. наук. 2001. Т. 171. № 5. С. 465. https://doi.org/10.3367/UFNr.0171.200105a.0465
- 26. Welstead S. Fractal and Wavelet Image Compression Techniques. SPIE Publications, 1999. 254 p.
