- PII
- S0023476125040016-1
- DOI
- 10.31857/S0023476125040016
- Publication type
- Article
- Status
- Published
- Authors
- Volume/ Edition
- Volume 70 / Issue number 4
- Pages
- 545-551
- Abstract
- Digital processing of the 2D noisy X-ray diffraction images (2D-XDI) of a single point defect in Si(111) crystal, registered at the level of dispersion of statistical Gaussian noise of the detector using filtering methods such as singular value decomposition and 1D-line-by-line smoothing of test 2D-XDIs, is carried out. The efficiency of digital filtering of 2D-XDI is evaluated and analyzed by means of control parameter FOM (figure-of-merit) value of reconstruction of the displacement field function of a point defect of Coulomb type f(r-r), (h - diffraction vector, r - radius-vector of the defect position in the sample). It is shown that the filtering technique using the singular value decomposition of 2D-XDI works significantly better than the 1D linear-by-line smoothing method of 2D-XDI, which, apparently, in relation to our problem requires further research on its improvement.
- Keywords
- Date of publication
- 18.03.2025
- Year of publication
- 2025
- Number of purchasers
- 0
- Views
- 14
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