- PII
- S0023476125040029-1
- DOI
- 10.31857/S0023476125040029
- Publication type
- Article
- Status
- Published
- Authors
- Volume/ Edition
- Volume 70 / Issue number 4
- Pages
- 552-559
- Abstract
- One presents and analyzes the results of computer processing for a plane-wave X-ray topography imaging of a point defect of the Coulomb-types in the Si(111) crystal recorded by an X-ray detector against a background of the Gaussian noise, and their subsequent filtering by using the 1D-, 2D-sized guided and a heuristic wavelet 4th-order Daubechie's atomic function. The filtering efficiency of a topography image is determined by the parameter of the averaged over all pixels relative square deviations of the pixel intensities (RMS.) of the processed and reference (noise-free) 2D image. Practical methods for selecting filtration parameters are proposed, using which the considered methods work well enough to be used in practice for the noise processing of plane-wave X-ray topography images, meaning their use for the 3D digital recovering nanosized crystal defects.
- Keywords
- Date of publication
- 14.05.2025
- Year of publication
- 2025
- Number of purchasers
- 0
- Views
- 14
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