Dynamics of Metal-Semiconductor and Reverse Semiconductor-Metal Phase Transitions in SmS Thin Films Induced by Mechanical and Thermal Influences

Volchkov, I.S.; Baskakov, E.B.; Khairetdinova, D.R.; Kanevsky, V.M.

doi:10.7868/S3034551025050067

PII

S30345510S0023476125050067-1

DOI

10.7868/S3034551025050067

Publication type

Article

Status

Published

Authors

I.S. Volchkov

Affiliation: Shubnikov Institute of Crystallography of the Kurchatov Complex Crystallography and Photonics of the NRC “Kurchatov Institute”

E.B. Baskakov

Affiliation: Shubnikov Institute of Crystallography of the Kurchatov Complex Crystallography and Photonics of the NRC “Kurchatov Institute”

D.R. Khairetdinova

Affiliation: Shubnikov Institute of Crystallography of the Kurchatov Complex Crystallography and Photonics of the NRC “Kurchatov Institute”

V.M. Kanevsky

Affiliation: Shubnikov Institute of Crystallography of the Kurchatov Complex Crystallography and Photonics of the NRC “Kurchatov Institute”

Volume/ Edition

Volume 70 / Issue number 5

Pages

759-766

Abstract

The article presents the findings of an investigation of SmS thin films phase transition dynamics, focusing on the semiconductor–metal transition induced by mechanical polishing and the reverse thermally induced metal–semiconductor transition. The results demonstrate that the reverse phase transition occurs during the sample cooling within the temperature range of 408–373 K. The change of phase and element composition of thin films is observed during the aforementioned phase transitions within the surface layer. The findings suggest that SmS thin films can be considered as structures with predictable and required phase transition dynamics, making them promising candidates for engineering functional materials and elements of pressure sensors operating over a wide range.

Keywords

Date of publication

27.02.2025

Year of publication

2025

Number of purchasers

Views

References

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GOST	Baskakov E., Kanevsky V., Khairetdinova D., Volchkov I. Dynamics of Metal-Semiconductor and Reverse Semiconductor-Metal Phase Transitions in SmS Thin Films Induced by Mechanical and Thermal Influences // Crystallography Reports. – 2025. – V. 70. – Issue number 5 C. 759-766 . URL: https://crystallographyras.ru/s30345510s0023476125050067-1/?version_id=121675. DOI: 10.7868/S3034551025050067
MLA	Baskakov, E.B, Kanevsky, V.M, Khairetdinova, D.R, Volchkov, I.S "Dynamics of Metal-Semiconductor and Reverse Semiconductor-Metal Phase Transitions in SmS Thin Films Induced by Mechanical and Thermal Influences." Crystallography Reports. 70.5 (2025).:759-766. DOI: 10.7868/S3034551025050067
APA	Baskakov E., Kanevsky V., Khairetdinova D., Volchkov I. (2025). Dynamics of Metal-Semiconductor and Reverse Semiconductor-Metal Phase Transitions in SmS Thin Films Induced by Mechanical and Thermal Influences. Crystallography Reports. vol. 70, no. 5, pp.759-766 DOI: 10.7868/S3034551025050067

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