- PII
- 10.31857/S0023476124050025-1
- DOI
- 10.31857/S0023476124050025
- Publication type
- Article
- Status
- Published
- Authors
- Volume/ Edition
- Volume 69 / Issue number 5
- Pages
- 764-770
- Abstract
- The results of computer simulation of images of gas pores in a silicon carbide crystal in sectional topograms, that is, during diffraction of a narrow beam of X-rays in the crystal, are presented for the first time. For this purpose, a special module of the universal computer program XRWP was used. This program is developing by the author to calculate the effects of coherent X-ray optics. The calculation method combines two methods, previously known, namely, Fourier transform methods (Kato method), and the method of solving the Takagi-Taupin equations. It is shown that gas pores can produce a wide variety of images, depending on the experimental conditions and the position of the gas pore inside the crystal.
- Keywords
- Date of publication
- 15.09.2025
- Year of publication
- 2025
- Number of purchasers
- 0
- Views
- 15
References
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